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H. H. Roh, J. S. Lee, D. L. Kim, J. Park, K. Kim, O. Kwon, S. H. Park, Y. K. Choi and A. Majumdar, “Novel Nanoscale Thermal Property Imaging Technique: The 2ω Method. II. Demonstration and Comparison,” Journal of Vacuum Science and Technology, Vol. B24, 2006, pp. 2405-2411.

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