Article citationsMore>>

B. H. Calhoun and A. P. Chandrakasan “Static Noise Margin Variation for Sub-threshold SRAM in 65 nm CMOS,” IEEE Journal of Solid-State Circuits, Vol. 41, No. 7, 2006, pp. 1673-1679. doi:10.1109/JSSC.2006.873215

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.