Article citationsMore>>

C. K. Park, S. M. Chang, H. S. Uhm, S. H. Seo and J. S. Park, “XPS and XRR Studies on Microstructures and Interfaces of DLC Films Deposited by FCVA Method,” Thin Solid Films, Vol. 420-421, 2002, pp. 235-240. doi:10.1016/S0040-6090(02)00750-2

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
Free SCIRP Newsletters
Copyright © 2006-2021 Scientific Research Publishing Inc. All Rights Reserved.
Top