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C. K. Park, S. M. Chang, H. S. Uhm, S. H. Seo and J. S. Park, “XPS and XRR Studies on Microstructures and Interfaces of DLC Films Deposited by FCVA Method,” Thin Solid Films, Vol. 420-421, 2002, pp. 235-240. doi:10.1016/S0040-6090(02)00750-2

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