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J. Hommel, M. Moser, M. Geiger, F. Scholz and H. Schwiser, “Investigations of Dry Etching in AlGaInP/GaInP Using CCl2F2/Ar Reactive Ion Etching and Ar Ion Beam Etching,” Journal of Vacuum Science & Technology B, Vol. 9, No. 6, 1991, pp. 3526-3529. doi:10.1116/1.585837

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