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has been cited by the following article:

• TITLE: Analysis of the Focusing Characteristics of Double Negative Binary Diffractive Lens

  AUTHORS: Zongxin Wang, Lizhi You

  KEYWORDS: Millimeter Wave Imaging, Binary Diffractive Lens, Double Negative Material

  JOURNAL NAME: Journal of Electromagnetic Analysis and Applications, Vol.2 No.9, October 12, 2010

  ABSTRACT: For a compact millimeter wave imaging system it is very important to design every component into small size, for the components in a millimeter wave system are usually much larger than those in an optical imaging system due to rela-tively long wave lengths. In this paper, we suggest a kind of binary diffractive lens (BDL) designed using double nega-tive materials (DNG) as the objective lens for a millimeter wave imaging system. The DNG-BDL has not only the ad-vantage of low profile but also small f number, which will be benefit for constructing a compact millimeter wave imaging system. Several DNG-BDL are designed and analyzed using the FDTD method. The numerical results of the focal plane field of the DNG-BDL are presented, which show that the DNG-BDL with small f number has relatively better focusing characteristic than that of a double positive BDL with same f number.