TITLE:
New Numerical Method to Calculate the True Optical Absorption of Hydrogenated Nanocrystalline Silicon Thin Films
AUTHORS:
Fatiha Besahraoui, Larbi Chahed, Yahia Bouizem, Jamal Dine Sib
KEYWORDS:
Solution Hydrogenated Nanocrystalline Silicon; Constant Photocurrent Method; Optical Absorption; Bulk Light Scattering; Surface Roughness; Film Thickness
JOURNAL NAME:
World Journal of Nano Science and Engineering,
Vol.2 No.1,
March
28,
2012
ABSTRACT: The enhanced optical absorption measured by Constant Photocurrent Method (CPM) of hydrogenated nanocrystalline silicon thin films is due mainly to bulk and/or surface light scattering effects. A new numerical method is presented to calculate both true optical absorption and scattering coefficient from CPM absorption spectra of nanotextured nano-crystalline silicon films. Bulk and surface light scattering contributions can be unified through the correlation obtained between the scattering coefficient and surface roughness obtained using our method.