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Cooman, A., Ferranti, F., Rolain, Y. and Vanderstein, G. (2016) Common-Denominator Modelling for Stability Analysis of Electronic Circuits. 11th European Microwave Integrated Circuits Conference, London, 3-4 October 2016, 361-364.
https://doi.org/10.1109/EuMIC.2016.7777565

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