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Luan, H.C., Lim, D.R., Lee, K.K., Chen, K.M., Sandland, J.G., Wada, K. and Kimerling, L.C. (1999) High-Quality Ge Epilayers on Si with Low Threading-Dislocation Densities. Applied Physics Letters, 75, 2909-2911. https://doi.org/10.1063/1.125187

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