TITLE:
On Radioactivity–Exposed Nanophotodetector Optoreliability
AUTHORS:
Emmanuel A. Anagnostakis
KEYWORDS:
Radiation-Hardness, Optoelectronic Reliability, Photodetectors, Photoresponsive Nanointerfaces, Quantum Efficiency & Detection Yield
JOURNAL NAME:
Journal of Modern Physics,
Vol.2 No.7,
July
29,
2011
ABSTRACT: The optoelectronic reliability of representative radioactivity-exposed nanophotodetectors and the degree of functionally tolerable radioactivity-induced responsivity de-emphasis, against increasing cumulative radioactivity-dose, is notionally considered and modelled, with a view towards experimental findings concerning p-i-n photosensors being exposed to regulated successive (α, β)-particle bombardments.