S. Inoue and S. Yamada, “A bivariate Weibull-type software reliability growth model and its goodness-of-fit evaluation,” (in Japanese) J. Information Processing Society of Japan, Vol. 49, no. 8, August 2008, pp. 2851 -2861.

has been cited by the following article:

• TITLE: A Bivariate Software Reliability Model with Change-Point and Its Applications

  AUTHORS: Shinji Inoue, Shigeru Yamada

  KEYWORDS: Software Reliability, Software Reliability Growth Factor, Change-Point, Bivariate Software Reliability Growth Model, Optimal Testing-Effort Expending Problem

  JOURNAL NAME: American Journal of Operations Research, Vol.1 No.1, March 25, 2011

  ABSTRACT: Testing-time when a change of a stochastic characteristic of the software failure-occurrence time or software failure-occurrence time-interval is observed is called change-point. It is said that effect of the change-point on the software reliability growth process influences on accuracy for software reliability assessment based on a software reliability growth model (SRGM). We propose an SRGM with the effect of the change-point based on a bivariate SRGM, in which the software reliability growth process is assumed to depend on the testing-time and testing-effort factors simultaneously, for accurate software reliability assessment. And we discuss an optimal software release problem for deriving optimal testing-effort expenditures based on our model. Further, we show numerical examples of software reliability assessment based on our bivariate SRGM and estimation of optimal testing-effort expenditures by using actual data.