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X. M. Chen, M. N. Wang, P. Cheng, X. L. Zhou, R. S. Ren, L. Hou, Y. Lu, J. Y. Feng and D. See, “Molecular Mapping of Wheat Genes for Effective All-Stage Resis-tance and High-Temperature Adult-Plant Resistance to Stripe Rust,” In: W.-Q. Chen, Ed., Disease Risk and Food Security, Proceedings of the 13th International Cereal Rusts and Powdery Mildews Conference, Beijing, 28 August-1 September 2012, China Agricultural Science and Technology Press, 2012, pp. 179-180.
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