Article citationsMore>>

G. Gulyamov, I. N. Karimov, N. Yu. Sharibaev and U. I. Erkaboev, “Determination of the Density of Surface States at the Semiconductor-Insulator Structures in Al-SiO2-Si and Al-SiO2-n-Si at Low Temperatures,” Uzbek Journal of Physic, Vol. 12, No. 3, 2010, pp. 143-146.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top