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Knaepen, W., Detavernier, C., Van Meirhaeghe, R.L., Sweet, J.J. and Lavoie, C. (2008) In-Situ X-Ray Diffraction Study of Metal Induced Crystallization of Amorphous Silicon. Thin Solid Films, 516, 4946-4952.
http://dx.doi.org/10.1016/j.tsf.2007.09.037

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