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M. Albrecht, H. P. Strunk, J. L. Weyher, I. Grzegory, S. Porowski and T. Wosinski, “Carrier Recomnination at Single Dislocation in GaN Measured by Cathodoluminescence in a Transmission Electron Microscope,” Journal of Applied Physics, Vol. 92, 2002, pp. 2000-2005. doi:10.1063/1.1490618

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