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T. Hoshimiya, H. Endoh and Y. Hiwatashi, “Observation of Surface Defects Using Photoacoustic Microscope and Quantitative Evaluation of the Defect Depth,” Japanese Journal of Applied Physics., Vol. 35, No. 5B, 1996, pp. 2916-2920. doi:10.1143/JJAP.35.2916
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