TITLE:
Optical Methods in Orientation of High-Purity Germanium Crystal
AUTHORS:
Guojian Wang, Yongchen Sun, Yutong Guan, Dongming Mei, Gang Yang, Angela Alanson Chiller, Bruce Gray
KEYWORDS:
Reflection Method; High-Purity Germanium Crystal
JOURNAL NAME:
Journal of Crystallization Process and Technology,
Vol.3 No.2,
April
30,
2013
ABSTRACT:
Two optical methods, namely crystal
facet reflection and etching pits reflection, were used to orient
and high-purity germanium crystals. The X-ray diffraction patterns
of three slices that were cut from the oriented and
crystals were measured by X-ray diffraction. The experimental errors of crystal
facet reflection method and etching pits reflection method are in the range of 0.05° - 0.12°. The crystal facet reflection
method and etching pits reflection method are extremely simple and cheap and
their accuracies are acceptable for characterizing high purity detector-grade
germanium crystals.