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J. W. Tschanz, J. T. Kao, S. Narendra, R. Nair, D. Antoniadis and A. P. Chandrakasan, “Adaptive Body Bias for Reducing Impacts of Die-to-Die and Within-Die Parameter Variations on Microprocessor Frequency and Leakage,” IEEE Journal of Solid-State Circuits, Vol. 37, No. 11, 2002, pp. 1396-1402. doi:10.1109/JSSC.2002.803949

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