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Bushroa, A.R., Rahbari, R.G., Masjuki, H.H. and Muhamad, M.R. (2012) Approximation of Crystallite Size and Microstrain via XRD Line Broadening Analysis in TiSiN Thin Films. Vacuum, 86, 1107-1112.
https://doi.org/10.1016/j.vacuum.2011.10.011

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