Article citationsMore>>

C.-H. Lin, B.-C. Hsu, M. H. Lee and C. W. Liu, “A Comprehensive Study of Inversion Current in MOS Tunneling Diodes,” IEEE Transactions on Electron Devices, Vol. 48, No. 9, 2001, pp. 2125-2130.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.