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O. Ozdemir, I. Atilgan, B. Akaoglu, K. Sel and B. Katircioglu, “Frequency Dependence of Conductivity in Intrinsic Amorphous Silicon Carbide Film, Assessed through Admittance Measurement of Metal Insulator Semiconductor Structure,” Thin Solid Films, Vol. 497, 2006, pp. 149-156.

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