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K. Lal and G. Bhagavannarayana, “A High-Resolution Diffuse X-Ray Scattering Study of Defects in Dislocation-Free Silicon Crystals Grown by the Float-Zone Me- thod and Comparison with Czochralski-Grown Crystals,” Journal of Applied Crystallography, Vol. 22, No. 3, 1989, pp. 209-215. http://dx.doi.org/10.1107/S0021889888014062

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