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M. Y. Chen, X. Lin, V. P. Dravid, Y. W. Chung, M. S. Wong and W. D. Sproul, “Growth and Characterization of C-N Thin Films,” Surface and Coatings Technology, Vol. 54-55, Pt. 2, 1992, pp. 360-364.
http://dx.doi.org/10.1016/S0257-8972(07)80048-X

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