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S. Vallerand and X. Maldague, “Defect Characterization in Pulsed Thermography: A Statistical Method Compared with Kohonen and Perceptron Neural Networks,” NDT & E International, Vol. 33, No. 5, 2000, pp. 307-315. http://dx.doi.org/10.1016/S0963-8695(99)00056-0

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