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M. Choi, K. Kang, J. Park, W. Kim and K. Kim, “Quantitative Determination of a Subsurface Defect of Reference Specimen by Lock-In Infrared Thermography,” NDT & E International, Vol. 41, No. 2, 2008, pp. 119-124. http://dx.doi.org/10.1016/j.ndteint.2007.08.006

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