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K. Nakamura, Y. Isono, T. Toriyama and S. Sugiyama, “First-Principles Simulation on Orientation Dependence of Piezoresistance Properties in Silicon Nanowires,” Japanese Journal of Applied Physics, Vol. 48, No. 6, 2009, Article ID: 06FG09. http://dx.doi.org/10.1143/JJAP.48.06FG09

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