Article citationsMore>>
N. Mirchin, B. Apter, I. Lapsker, V. Fogel, U. Gorodetsky, S. A. Popescu, A. Peled, G. Popescu-Pelin, G. Dorcioman, L. Duta, A. Popescu and I. N. Mihailescu, “Measuring Nanolayer Profiles of Various Materials by Evanescent Light Technique,” Journal of Nanoscience and Nantechnology, Vol. 12, No. 3, 2012, pp. 2668-2671.
doi:10.1166/jnn.2012.5788
has been cited by the following article:
Related Articles:
-
Song Shi, Guanyu Wang, Yingcong Xiang, Chuan Guo, Xing Wang, Yinlin Pu, Huilan Li, Zhixian Li
-
D. Subba Reddy, M. Bhaskar Reddy, N. Nanda Kumar Reddy, V. Rajagopal Reddy
-
Dennis M. Doren, James Harasymiw
-
Ha Cheol Lee
-
A. González-Sánchez, A. Gutiérrez-Rodríguez, M. A. Hernández-Ruíz