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L. I. Fedina and A. L. Aseev, “Atomic Mechanisms of Clustering of Intrinsic Point Defects in Si,” In: A. L. Aseev, Ed., Nanotechnology in Semiconductor Electronics, Sibirean Branch Russian Academy of Sciences, Novosibirsk, 2004, pp. 179-201. http://85.142.23.144/packages/mifi/5E6AE615-986F-4DE6-8BAB-1190A19D7E93/1.0.0.0/15.pdf

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