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M. Zmeck, J. Phang, A. Bettiol, T. Osipowicz, F. Watt, L. Balk, F.-J. Niedernostheide, H.-J. Schulze, E. Falck and R. Barthelmess, “Analysis of High-Power Devices Using Proton Beam Induced Charge Microscopy,” Microelectronics Reliability, Vol. 41, No. 9-10, 2001, pp. 1519-1524. doi:10.1016/S0026-2714(01)00159-7

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