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L. Dal Negro, M. Stolfi, Y. Yi, J. Michel, X. Duan, L. C. Kimerling, J. Le Blanc and J. Haavisto, “Photon Band Gap Properties and Omnidirectional reflectance in Si/ SiO2 Thue-Morse Quasicrystals,” Applied Physics Letters, Vol. 84, No. 25, 2004, pp. 5186-5188.
doi:10.1063/1.1764602
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