TITLE:
Microstructure Analysis and Properties of Anti-Reflection Thin Films for Spherical Silicon Solar Cells
AUTHORS:
Masato Kanayama, Takeo Oku, Tsuyoshi Akiyama, Youichi Kanamori, Satoshi Seo, Jun Takami, Yoshimasa Ohnishi, Yoshikazu Ohtani, Mikio Murozono
KEYWORDS:
Solar Cells; Spherical Silicon; Anti-Reflection Film; FTO; SnO2
JOURNAL NAME:
Energy and Power Engineering,
Vol.5 No.2A,
April
29,
2013
ABSTRACT:
Structure and properties of anti-reflection thin films of spherical
silicon solar cells were investigated and discussed. Conversion efficiencies of
spherical Si solar cells coated with F-doped SnO2 anti-reflection
films were improved by annealing. Optical absorption and fluorescence of the
solar cells increased after annealing. Lattice constants of F-doped SnO2 anti-reflection layers, which were investigated by X-ray diffraction, decreased
after annealing. A mechanism of atomic diffusion of F in SnO2 was
discussed. The present work indicated a guideline for spherical silicon solar
cells with higher efficiencies.