TITLE:
Structural and Surface Morphology Analysis of Nickel Phthalocyanine Thin Films
AUTHORS:
Mohammed T. Hussein, Eman M. Nasir, Addnan H. Al-Aarajiy
KEYWORDS:
Nickel Phthalocyanine; Organic; XRD; AFM; Morphology; Thin Film; Structure
JOURNAL NAME:
Advances in Materials Physics and Chemistry,
Vol.3 No.1A,
April
28,
2013
ABSTRACT:
The thin films of Nickel Phthalocyanine (NiPc) on glass substrates were prepared by vacuum evaporation at
different substrates temperatures (300, 325, 350, 400,
450) K. The structure
and surface morphology of NiPc in powder and thin film forms (265 nm) were studied using X-ray diffraction and
atomic force microscope (AFM), and showed that there was a change and enhance in the
crystallinity and surface morphology due to change in the substrates temperatures. Analysis of X-rays diffraction patterns of NiPc in powder form showed
that it had an α-polycrystalline phase with monoclinic
system with lattice constants a = 1.513 nm, b = 0.462 nm, c = 2.03 nm and β = 123.46°. Thermal evaporation of NiPc at
different substrates temperatures led to β-crystalline
films oriented preferentially to the (100) plane with different substrate
temperatures. The mean crystallite size increased with substrates
temperatures from 300 K to
450 K. This result was supported by AFM measurements, which exhibited a
relatively larger grain size.