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C. H. Kim, K. Roy, S. Hsu, R. Krishnamurthy and S. Borkar, “A Process Variation Compensating Technique with an On-Die Leakage Current Sensor for Nanometer Scale Dynamic Circuits,” IEEE Transactions on VLSI Systems, Vol. 14, No. 6, 2006, pp. 646-649. doi:10.1109/TVLSI.2006.878226

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