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W. Spielmeyer, R. P. Singh, H. McFadden, C. R. Wellings, J. Huerta-Espino, X. Kong, R. Appels and E. S. Lagudah, “Fine Scale Genetic and Physical Mapping Using Interstitial Deletion Mutants of Lr34/Yr18: A Disease Resistance Locus Effective against Multiple Pathogens in Wheat,” Theoretical and Applied Genetics, Vol. 116, No. 4, 2008, pp. 481-490. doi:10.1007/s00122-007-0684-0

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