Article citationsMore>>
Z. X. Shi, X. M. Chen, R. F. Line, H. Leung and C. R. Wellings, “Development of Resistance Gene Analog Poly-morphism Markers for the Yr9 Gene Resistance to Wheat Stripe Rust,” Genome, Vol. 44, No. 4, 2001, pp. 509-516.
has been cited by the following article:
Related Articles:
-
Navjot Kaur Dhillon, Harcharan Singh Dhaliwal
-
Navjot Kaur Dhillon, Harcharan Singh Dhaliwal
-
Seyed Taha Dadrezaei, Kumarse Nazari, Farzad Afshari, Ebrahim Mohammadi Goltapeh
-
Risara Jaksuwan, Prasit Tharavichikul, Charoen Chuchottaworn, Jayanton Patumanond, Piyada Kunawararak, Jongkolnee Settakorn
-
F. O. Amulaka, J. N. Maling’a, R. S. Pathak, M. Cakir, R. M. S. Mulwa