Article citationsMore>>

M. Lin and M. N. Safer, “A New Cavity Perturbation Technique for Accurate Measurement of Dielectric Parameters,” Ieee Mtt-S International Microwave Symposium Digest, San Francisco, 11-16 June 2006, pp. 1630- 1633.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top