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J. Coraux, H. Renevier, V. Fa-vre-Nicolin, G. Renaud, and B. Daudin, “In situ resonant x-ray study of vertical correlation and capping effects during GaN/AlN quantum dot growth”, J. Appl. Phys, Vol. 88, No. 15, 2007, pp.1-3. doi: 10.1063/1.2192572

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