Article citationsMore>>

J. D. M. Rennie, L. Shih, J. Teevan and D. R. Karge, “Tackling the Poor Assumptions of Naive Bayes Text Classifier,” Proceeding of the 20th International Conference on Machine Learning, Washington DC, 2003, 6 p.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top