N. G. Blamires and J. Myatt, “X-Ray Effects on Pacemaker Type Circuits,” Pacing and Clinical Electrophysiology, Vol. 5, No. 2, 1982, pp. 151-155. doi:10.1111/j.1540-8159.1982.tb02206.x

has been cited by the following article:

• TITLE: Predicting and Suppressing Oversensing of a Pacemaker in Plain X-Ray Photography

  AUTHORS: Norihiko Akiba, Masashi Takeda, Giichiro Nakaya, Osamu Nakamura, Joel Matsumoto, Kyoichi Ito, Morio Shimada, Kohki Yoshikawa

  KEYWORDS: Oversensing; Pacemaker; C-MOS; General X-Ray Equipment for Diagnosis

  JOURNAL NAME: Open Journal of Radiology, Vol.2 No.4, December 19, 2012

  ABSTRACT: We conducted experiments of oversensing generation of pacemaker (PM) and X-irradiation direction dependency of PM, and examined the oversensing suppression method, using 8 different types of PMs. It was found out from this experiment that oversensing would occur when some conditions (X-irradiation direction, X-irradiation intensity) are met. Oversensing occurred with the most low irradiation conditions (kV × mA) when PM was irradiated at 90° (vertically to C-MOS; Complementary Metal Oxide Semiconductor). The acuter the angle of irradiation is (α > 90°