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P. H. Woerlee, M. J. Knitel, R. V. Langevelde, D. B. Klaassen, L. F. Tiemeijer and A. J. Scholten, “RF CMOS Performance Trends,” IEEE Transaction on Electron De-vices, Vol. 48, No. 8, August 2001, pp. 1776-1782.

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