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S. H. Lo, D. A. Buchanan and Y. Taur, “Modeling and Characterization of Quantization, Polysilicon Depletion, and Direct Tunneling Effects in MOSFETs with Ultrathin Oxides,” IBM Journal of Research and Development, Vol. 43, No. 3, 1999, pp. 327-337. doi:10.1147/rd.433.0327

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