Article citationsMore>>

P. C. Liao, W. S. Ho, Y. S. Huang and K. K. Tiong, “Characterization of Sputtered Iridium Dioxide Thin Films,” Journal of Materials Research, Vol. 13, No. 5, 1998, pp. 1318-1326. doi:10.1557/JMR.1998.0187

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top