Article citationsMore>>

M. V. Sopinskyy, P. E. Shepelyavyi, A. V. Stronski and E. F. Venger, “Ellipsometry and AFM Study of Post- Deposi-tion Transformations in Vacuum-Evaporated As-S-Se Films,” Journal of Optoelectronics and Advanced Mate-rials, Vol. 7, No. 5, 2005, pp. 2255- 2266.

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top