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B. P. Swain, “The Analysis of Carbon Bonding Environment in HWCVD Deposited a-SiC:H Films by XPS and Raman Spectroscopy,” Surface and Coatings Technology, Vol. 201, No. 3-4, 2006, pp. 1589-1593. doi:10.1016/j.surfcoat.2006.02.029

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