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E. V. Monakhov, R. Balasundaraprabhu, N. Muthukumarasamy and B. G. Svensson, “Electronic Properties of the Interface between Si and Sputter Deposited Indium- Tin Oxide,” Materials Science and Engineering: B, Vol. 159-160, 2009, pp. 314-317. doi:10.1016/j.mseb.2008.11.023

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