T. El-Ashram, “The Relation between Valency, Axial Ratio, Young’s Modulus and Resistivity of Rapidly Solidified Tin-Based Eutectic Alloys,” Journal of Materials Science: Materials in Electronics, Vol. 16, 2005, pp. 501-505. doi:10.1007/s10854-005-2724-3

has been cited by the following article:

• TITLE: The Role of Valence Electron Concentration on the Structure and Properties of Rapidly Solidified Sn-Ag Binary Alloys

  AUTHORS: M. Kamal, A. B. El-Bediwi, T. El-Ashram, M. E. Dorgham

  KEYWORDS: Alloys; Rapid Solidification; Valence Electron Concentration; Resistivity; Young’s Modulus; Fermi Energy; Brillouin Zone

  JOURNAL NAME: Materials Sciences and Applications, Vol.3 No.3, March 23, 2012

  ABSTRACT: A group of binary Sn-xAg alloys (x = 0.5, 1.5, 2.5, 3.5, 4.5, 5.5 and 6.5 wt%) has been produced by a single copper roller melt-spinning technique. In this study the interaction between Fermi sphere and Brillouin zone and Hume-Rothery condition of phase stability have been verified. It is found that by increasing valence electron concentration VEC the diameter of Fermi sphere 2kF increases which leads to the increase in the diameter of Brillouin zone which arises from the decrease in volume of the unit cell. It is found that the electrical resistivity increases by increasing VEC due to the decrease in relaxation time τ with increasing VEC. Also it has been confirmed that the correlation between Young’s modulus and the axial ratio c/a of β-Sn unit cell.