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J. E. Gagnon, B. J. Fryer, I. M. Samson and A. E. Williams-Jones, “Quantitative Analysis of Silicate Certified Reference Materials by LA-ICP-MS with and without an Internal Standard,” Journal of Analytical Atomic Spectrometry, Vol. 23, No. 11, 2008, pp. 1529-1537. doi:10.1039/b801807n

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