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R. Ishihara, D. Danciu, F. Tichelaar, M. He, Y. Hiroshima, S. Inoue, T. Shimoda, J.W. Metselaar and C. I. M. Be- enakker, “Microstructure Characterization of Location- Controlled Si-Islands Crystallized by Excimer Laser in the μ-Czochralski (Grain Filter) Process,” Journal of Crystal Growth, Vol. 299, No. 2, 2007, pp. 316-321. doi:10.1016/j.jcrysgro.2006.12.010

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