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Soni, D., Nabeel, M., Basu, K. and Karri, R. (2019) Power, Area, Speed, and Security (PASS) Trade-Offs of NIST PQC Signature Candidates Using a C to ASIC Design Flow. 2019 IEEE 37th International Conference on Computer Design (ICCD), Abu Dhabi, 17-20 November 2019, 337-340.
https://doi.org/10.1109/ICCD46524.2019.00054

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