Yadav, N.P., Xiong, J.C., Wang, W.Z. and Liu, X.F. (2021) Resolving Deep Sub-Wavelength Scattering of Semiconductor Devices Using Parametric Microscopy. Journal of Electronic Science and Technology, 19, Article ID: 100094.
https://doi.org/10.1016/j.jnlest.2021.100094

has been cited by the following article:

• TITLE: Investigation of Tablet Defects by AI Based Terahertz Technology

  AUTHORS: Nagendra P. Yadav, Guozhen Hu, Rakesh Kumar Singh

  KEYWORDS: THz Radiation, Nano Drugs, Tablets Sample, Covid-19, Medical Application, 3D Imaging, Layer in Tablet, AI

  JOURNAL NAME: Open Journal of Antennas and Propagation, Vol.11 No.2, May 8, 2023

  ABSTRACT: Recently a lot of medical tablets with special packets in the global market are available. For the safety and purity of the tablet, we need to scan it by developed scanner technology, which should be not more expensive and easily available in the market. The THz technology is one of them. In the proposed work, we have tasted tablet images with the help of the THz super-resolution scanner, which is already available in our lab. The AI machine learning data concept has been investigated. Good resolution of images has been obtained. Furthermore, the challenging research problems are discussed. Finally, it summarizes the recent updates in terahertz technology for drug inspection and medical applications with potential research challenges.