TITLE:
Effect of Substrate Nature on the Structural, Optical and Electrical Properties of In2S3 Thin Films
AUTHORS:
Fethi Aousgi, Youssef Trabelsi, Aoussaj Sbai, Billel Khalfallah, Radhouane Chtourou
KEYWORDS:
In2S3, Vacuum Evaporation, Thin Films, X-Ray Diffraction, UV-Vis Spectrophotometer, Photovoltaic
JOURNAL NAME:
Journal of Materials Science and Chemical Engineering,
Vol.10 No.5,
May
17,
2022
ABSTRACT: In this
study, In2S3 thin films have been deposited on ITO and
fluorine-tinoxide FTO coated glass substrates by single source vacuum thermal
evaporation annealed in vacuum a 300°C - 400°C for 1 h. The samples structure
was characterized by X-ray diffraction, revealing the quadratic structure of In2S3 and the crystallinity depends on the temperature of annealing and nature of
substrate. The various structural parameters, such as, crystalline size,
dislocation density, strain and texture coefficient were calculated. The
optical properties show that the refractive index dispersion data obeyed the
single oscillator of the Wemple-DiDomenico
model. By using this model, the dispersion parameters and the high-frequency
dielectric constant were determined. The Hall Effect has been studied at room
temperature. The Hall voltages, the Hall coefficient (RH) and mobility (μH) have been measured at different
magnetic and electric fields. The films show
n-type behavior irrespective of temperature and composition.